Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low-Power Devices Edited by: Patrick Girard, Research Director, CNRS / LIRMM, France Nicola Nicolici, Associate Professor, McMaster University, Canada Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan Managing the power consumption of circuits...
| Corporate Author: | |
|---|---|
| Other Authors: | , , |
| Format: | Electronic |
| Language: | English |
| Published: |
Boston, MA :
Springer US,
2010.
|
| Subjects: | |
| Online Access: | https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-1-4419-0928-2 |