Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies /
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and d...
| Main Authors: | , , , , |
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| Corporate Author: | |
| Format: | Electronic |
| Language: | English |
| Published: |
Boston, MA :
Springer US,
2010.
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| Edition: | 1. |
| Subjects: | |
| Online Access: | View fulltext via EzAccess |