High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and te...
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| Format: | Electronic |
| Language: | English |
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Boston, MA :
Springer US,
2003.
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| Series: | Frontiers in Electronic Testing,
22A |
| Subjects: | |
| Online Access: | View fulltext via EzAccess |