Noncontact Atomic Force Microscopy Volume 2 /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Morita, Seizo. (Editor), Giessibl, Franz J. (Editor), Wiesendanger, Roland. (Editor)
• Format: Electronic
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
• Series: NanoScience and Technology,
• Subjects: Engineering.; Nanotechnology.; Materials Science.; Engineering, general.; Condensed Matter Physics.
• Online Access: https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-3-642-01495-6

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and...

Table of Contents:

• Introduction
• Method for Precise Force Measurements
• Force Spectroscopy on Semiconductors
• Tip-sample Interactions as a Function of Distance on Insulating Surfaces
• Imaging and Force Spectroscopy on Layered Materials
• Principles and Applications of the qPlus Sensor
• Atomic Resolution Imaging and Site-Specific Spectroscopy on Model Catalyst
• Atom Manipulation on Semiconductor Surfaces
• Atomic Manipulation on Metal Surfaces
• Atom Manipulation on Insulator Surfaces
• Simulations on Atomic Manipulation on Semiconductor Surfaces
• Multi-Scale Modeling of NC-AFM Imaging and Controlling Atomic Dynamics at Insulating Surfaces
• Magnetic Exchange Force Microscopy
• Frequency Modulation Atomic Force Microscopy in Liquids
• Biological Applications of FM-AFM for Liquid Environment
• Low Amplitude High-Frequency Imaging with Deflection and Torsion of the Cantilever in Vacuum and Liquid
• Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.-.