Noncontact Atomic Force Microscopy Volume 2 /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Morita, Seizo. (Editor), Giessibl, Franz J. (Editor), Wiesendanger, Roland. (Editor)
• Format: Electronic
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
• Series: NanoScience and Technology,
• Subjects: Engineering.; Nanotechnology.; Materials Science.; Engineering, general.; Condensed Matter Physics.
• Online Access: https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-3-642-01495-6
• Physical Description: XVIII, 401p. 105 illus., 77 illus. in color. online resource.
• ISBN: 9783642014956
• ISSN: 1434-4904

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.