Noncontact Atomic Force Microscopy Volume 2 /

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Morita, Seizo. (Editor), Giessibl, Franz J. (Editor), Wiesendanger, Roland. (Editor)
Format: Electronic
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
Series:NanoScience and Technology,
Subjects:
Online Access:https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-3-642-01495-6