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100301s2009 gw | s |||| 0|eng d |
| 020 |
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|a 9783642014956
|9 978-3-642-01495-6
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| 024 |
7 |
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|a 10.1007/978-3-642-01495-6
|2 doi
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| 050 |
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|a T174.7
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|a TA418.9.N35
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|a TBN
|2 bicssc
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|a TEC027000
|2 bisacsh
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|a SCI050000
|2 bisacsh
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| 082 |
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|a 620.115
|2 23
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| 100 |
1 |
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|a Morita, Seizo.
|e editor.
|
| 245 |
1 |
0 |
|a Noncontact Atomic Force Microscopy
|b Volume 2 /
|c edited by Seizo Morita, Franz J. Giessibl, Roland Wiesendanger.
|h [electronic resource] :
|
| 264 |
# |
1 |
|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg,
|c 2009.
|
| 300 |
# |
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|a XVIII, 401p. 105 illus., 77 illus. in color.
|b online resource.
|
| 336 |
# |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 347 |
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|a text file
|b PDF
|2 rda
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| 490 |
1 |
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|a NanoScience and Technology,
|x 1434-4904
|
| 505 |
0 |
# |
|a Introduction -- Method for Precise Force Measurements -- Force Spectroscopy on Semiconductors -- Tip-sample Interactions as a Function of Distance on Insulating Surfaces -- Imaging and Force Spectroscopy on Layered Materials -- Principles and Applications of the qPlus Sensor -- Atomic Resolution Imaging and Site-Specific Spectroscopy on Model Catalyst -- Atom Manipulation on Semiconductor Surfaces -- Atomic Manipulation on Metal Surfaces -- Atom Manipulation on Insulator Surfaces -- Simulations on Atomic Manipulation on Semiconductor Surfaces -- Multi-Scale Modeling of NC-AFM Imaging and Controlling Atomic Dynamics at Insulating Surfaces -- Magnetic Exchange Force Microscopy -- Frequency Modulation Atomic Force Microscopy in Liquids -- Biological Applications of FM-AFM for Liquid Environment -- Low Amplitude High-Frequency Imaging with Deflection and Torsion of the Cantilever in Vacuum and Liquid -- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.-.
|
| 520 |
# |
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|a Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
|
| 650 |
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0 |
|a Engineering.
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| 650 |
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0 |
|a Nanotechnology.
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| 650 |
1 |
4 |
|a Materials Science.
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| 650 |
2 |
4 |
|a Nanotechnology.
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| 650 |
2 |
4 |
|a Engineering, general.
|
| 650 |
2 |
4 |
|a Condensed Matter Physics.
|
| 700 |
1 |
# |
|a Giessibl, Franz J.
|e editor.
|
| 700 |
1 |
# |
|a Wiesendanger, Roland.
|e editor.
|
| 710 |
2 |
# |
|a SpringerLink (Online service)
|
| 773 |
0 |
# |
|t Springer eBooks
|
| 776 |
0 |
8 |
|i Printed edition:
|z 9783642014949
|
| 830 |
# |
0 |
|a NanoScience and Technology,
|x 1434-4904
|
| 856 |
4 |
0 |
|u https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-3-642-01495-6
|
| 912 |
# |
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|a ZDB-2-CMS
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| 950 |
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|a Chemistry and Materials Science (Springer-11644)
|