Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have...
Main Authors: | Bushnell, Michael L. (Author), Agrawal, Vishwani D. (Author) |
---|---|
Corporate Author: | SpringerLink (Online service) |
Format: | Electronic |
Language: | English |
Published: |
Boston, MA :
Springer US,
2002.
|
Series: | Frontiers in Electronic Testing,
17 |
Subjects: | |
Online Access: | View fulltext via EzAccess |
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