Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have...

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Bibliographic Details
Main Authors: Bushnell, Michael L. (Author), Agrawal, Vishwani D. (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic
Language:English
Published: Boston, MA : Springer US, 2002.
Series:Frontiers in Electronic Testing, 17
Subjects:
Online Access:View fulltext via EzAccess