Factors Governing Tin Whisker Growth
Tin (Sn) whiskers are electrically conductive, single crystal eruptions that grow from Sn film surfaces. Their high aspect ratio presents reliability problems for the electronics industry due to bridging and metal arcing, leading to malfunctions and catastrophic failures in many electronic systems (...
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| Format: | Electronic |
| Language: | English |
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Cham :
Springer International Publishing : Imprint: Springer,
2013.
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| Series: | Springer Theses, Recognizing Outstanding Ph.D. Research,
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| Online Access: | https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-3-319-00470-9 |