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100907s2010 gw | s |||| 0|eng d |
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|a 9783642024177
|9 978-3-642-02417-7
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|a 10.1007/978-3-642-02417-7
|2 doi
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|a QC350-467
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|a TA1501-1820
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|a QC392-449.5
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|a TA1750-1750.22
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|a TTB
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|a PHJ
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|a TEC030000
|2 bisacsh
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|a 621.36
|2 23
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|a Breitenstein, Otwin.
|e author.
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|a Lock-in Thermography
|b Basics and Use for Evaluating Electronic Devices and Materials /
|c by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.
|h [electronic resource] :
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|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg,
|c 2010.
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|a X, 258 p.
|b online resource.
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a text file
|b PDF
|2 rda
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|a Springer Series in Advanced Microelectronics,
|v 10
|x 1437-0387 ;
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|a Introduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.
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|a This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.
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|a Physics.
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|a Engineering.
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|a Materials.
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|a Surfaces (Physics).
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|a Physics.
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|a Optics, Optoelectronics, Plasmonics and Optical Devices.
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|a Characterization and Evaluation of Materials.
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|a Engineering, general.
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|a Structural Materials.
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|a Warta, Wilhelm.
|e author.
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|a Langenkamp, Martin.
|e author.
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|a SpringerLink (Online service)
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|t Springer eBooks
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|i Printed edition:
|z 9783642024160
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|a Springer Series in Advanced Microelectronics,
|v 10
|x 1437-0387 ;
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|u https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-3-642-02417-7
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|a ZDB-2-ENG
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|a Engineering (Springer-11647)
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