Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials /

• Main Authors: Breitenstein, Otwin. (Author), Warta, Wilhelm. (Author), Langenkamp, Martin. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010.
• Series: Springer Series in Advanced Microelectronics, 10
• Subjects: Physics.; Engineering.; Materials.; Surfaces (Physics).; Optics, Optoelectronics, Plasmonics and Optical Devices.; Characterization and Evaluation of Materials.; Engineering, general.; Structural Materials.
• Online Access: https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-3-642-02417-7
• Physical Description: X, 258 p. online resource.
• ISBN: 9783642024177
• ISSN: 1437-0387

This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.