Extreme Statistics in Nanoscale Memory Design

• Corporate Author: SpringerLink (Online service)
• Other Authors: Singhee, Amith. (Editor), Rutenbar, Rob A. (Editor)
• Format: Electronic
• Language: English
• Published: Boston, MA : Springer US : Imprint: Springer, 2010.
• Edition: 1.
• Series: Integrated Circuits and Systems,
• Subjects: Engineering.; Electronics.; Systems engineering.; Circuits and Systems.; Electronics and Microelectronics, Instrumentation.
• Online Access: https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-1-4419-6606-3

Extreme Statistics in Nanoscale Memory Design brings together some of the worlds leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme stat...

Table of Contents:

• Introduction
• Extreme Statistics in Memories
• Statistical Nano CMOS Variability and its Impact on SRAM
• Importance Sampling-Based Estimation: Applications to Memory Design
• Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics
• Yield Estimation by Computing Probabilistic Hypervolumes
• Most Probable Point Based Methods
• Extreme Value Theory: Application to Memory Statistics.