Extreme Statistics in Nanoscale Memory Design
Extreme Statistics in Nanoscale Memory Design brings together some of the worlds leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme stat...
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| Other Authors: | , |
| Format: | Electronic |
| Language: | English |
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Boston, MA :
Springer US : Imprint: Springer,
2010.
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| Edition: | 1. |
| Series: | Integrated Circuits and Systems,
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| Subjects: | |
| Online Access: | https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-1-4419-6606-3 |