Advanced Computing in Electron Microscopy

• Main Author: Kirkland, Earl J. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic
• Language: English
• Published: Boston, MA : Springer US, 2010.
• Subjects: Computer engineering.; Surfaces (Physics).; Materials Science.; Characterization and Evaluation of Materials.; Electrical Engineering.
• Online Access: View fulltext via EzAccess

Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. T...

Table of Contents:

• Introduction
• The transmission electron microscope
• Linear image approx
• Sampling and the fast fourier transform
• Calculating images of thin specimens
• Calculating images of thick specimens
• Some worked examples
• Program details
• App. A: Atomic potentials and scattering factors
• App. B: The fourier projection theorem
• App. C: Bilinear interpolation
• App. D: 3D perspective view.