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100812s2010 xxu| s |||| 0|eng d |
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|a 9781441965332
|9 978-1-4419-6533-2
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|a 10.1007/978-1-4419-6533-2
|2 doi
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|a TA404.6
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|a TGMT
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|a TEC021000
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|a 620.11
|2 23
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|a Kirkland, Earl J.
|e author.
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|a Advanced Computing in Electron Microscopy
|c by Earl J. Kirkland.
|h [electronic resource] /
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|a Boston, MA :
|b Springer US,
|c 2010.
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|a X, 289p. 250 illus., 125 illus. in color.
|b online resource.
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|a text
|b txt
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|a computer
|b c
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|a online resource
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|a text file
|b PDF
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|a Introduction -- The transmission electron microscope -- Linear image approx -- Sampling and the fast fourier transform -- Calculating images of thin specimens -- Calculating images of thick specimens -- Some worked examples -- Program details -- App. A: Atomic potentials and scattering factors -- App. B: The fourier projection theorem -- App. C: Bilinear interpolation -- App. D: 3D perspective view.
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|a Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field. This enhanced second edition includes: -descriptions of new developments in the field -updated references -additional material on aberration corrected instruments and confocal electron microscopy -expanded and improved examples and sections to provide stronger clarity
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|a Computer engineering.
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|a Surfaces (Physics).
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|a Materials Science.
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|a Characterization and Evaluation of Materials.
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|a Electrical Engineering.
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|a SpringerLink (Online service)
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|t Springer eBooks
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|i Printed edition:
|z 9781441965325
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|z View fulltext via EzAccess
|u https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-1-4419-6533-2
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|a ZDB-2-PHA
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|a Physics and Astronomy (Springer-11651)
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