APA Citation

Bosio, A. (2010). Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (1.). Boston, MA: Springer US.

Chicago Style Citation

Bosio, Alberto. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. 1. Boston, MA: Springer US, 2010.

MLA Citation

Bosio, Alberto. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. 1. Boston, MA: Springer US, 2010.

Warning: These citations may not always be 100% accurate.