Electron Backscatter Diffraction in Materials Science

• Corporate Author: SpringerLink (Online service)
• Other Authors: Schwartz, Adam J. (Editor), Kumar, Mukul. (Editor), Adams, Brent L. (Editor), Field, David P. (Editor)
• Format: Electronic
• Language: English
• Published: Boston, MA : Springer US, 2009.
• Subjects: Physical geography.; Materials.; Surfaces (Physics).; Materials Science.; Materials Science, general.; Condensed Matter Physics.; Geophysics/Geodesy.; Characterization and Evaluation of Materials.
• Online Access: https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-0-387-88136-2

 Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystalline materials. The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories within the past decade due to the wide availability of SEMs, the ease of sample preparation from the bulk, the high speed of data acquisition, and the access to complimentary information about the microstructure on a submicron scale. This entirely new second edition describes the complete EBSD technique, from the experimental set-up, representations of textures, and dynamical simulation, to energy-filtered, spherical, and 3-D EBSD, to phase identification, in situ experiments, strain mapping, and grain boundary networks, to the design and modeling of materials microstructures. Numerous application examples including the analysis of deformation microstructure, dynamic deformation and damage, and EBSD studies in the earth sciences provide details of this powerful materials characterization technique.