Electron Backscatter Diffraction in Materials Science
Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routi...
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| Other Authors: | , , , |
| Format: | Electronic |
| Language: | English |
| Published: |
Boston, MA :
Springer US,
2009.
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| Subjects: | |
| Online Access: | https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-0-387-88136-2 |