FIB Nanostructures

• Corporate Author: SpringerLink (Online service)
• Other Authors: Wang, Zhiming M. (Editor)
• Format: Electronic
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2013.
• Series: Lecture Notes in Nanoscale Science and Technology, 20
• Subjects: Materials science.; Nanochemistry.; Nanoscale science.; Nanoscience.; Nanostructures.; Semiconductors.; Nanotechnology.; Optical materials.; Electronic materials.; Materials Science.; Nanotechnology and Microengineering.; Nanoscale Science and Technology.; Optical and Electronic Materials.
• Online Access: View fulltext via EzAccess

FIB Nanostructures reviews a range of methods, including milling, etching, deposition, and implantation, applied to manipulate structures at the nanoscale. Focused Ion Beam (FIB) is an important tool for manipulating the structure of materials at the nanoscale, and substantially extends the range of...

Table of Contents:

• Preface
• Chapter 1: Focused Ion Beam (FIB) technology for micro and nanoscale fabrications
• Chapter 2: Epitaxial ferroelectric nanostructures fabricated by FIB milling
• Chapter 3: Low current focused-ion-beam milling for freestanding nanomaterial characterization
• Chapter 4: Focused ion beam milling of carbon nanotube yarns and Bucky-papers: Correlating their internal structure with their macro-properties
• Chapter 5: Nanoscale electrical contacts grown by Focused-Ion-Beam (FIB) Induced Deposition
• Chapter 6: Metal induced crystallization of focused ion beam induced deposition for functional patterned ultrathin nanocarbon
• Chapter 7: Deterministic Fabrication of Micro- and Nano-Structures by Focused Ion Beam
• Chapter 8: Application of ion beam processes to scanning probe microscopy
• Chapter 9: Fabrication of needle-shaped specimens containing sub-surface nanostructures for Electron Tomography
• Chapter 10: Fabrication technique of deformation carriers (gratings and speckle patterns) with FIB for micro/nano-scale deformation measurement
• Chapter 11: Controlled Quantum Dot Formation on Focused Ion Beam patterned GaAs Substrates
• Chapter 12: Development of Functional Metallic Glassy Materials by FIB and Nano-imprint Technologies
• Chapter 13: Nanostructured Materials Driven by Dielectrophoresis on Nanoelectrods Patterned by Focused Ion Beam
• Chapter 14: Focused Ion Beam Assisted Nano-Scale Processing and Thermoelectrical Characterization
• Chapter 15: FIB design for Nanofluidic applications
• Chapter 16: FIB Patterning of Stainless Steel for the Development of Nano-Structured Stent Surfaces for Cardiovascular Applications
• Chapter 17: Evaluation of damages induced by Ga+ focused ion beam in piezoelectric nanostructures
• Chapter 18: Instabilities in Focused Ion Beam-patterned nanostructures
• Chapter 19: Nanostructures by mass-separated FIB
• Index.