High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

• Main Author: Adams, R. Dean. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic
• Language: English
• Published: Boston, MA : Springer US, 2003.
• Series: Frontiers in Electronic Testing, 22A
• Subjects: Engineering.; Computer-aided engineering.; Electrical engineering.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.; Computer-Aided Engineering (CAD, CAE) and Design.
• Online Access: View fulltext via EzAccess

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and te...

Table of Contents:

• Test of Memories
• Opening PandoraỚ"s Box
• Static Random Access Memories
• Multi-Port Memories
• Silicon On Insulator Memories
• Content Addressable Memories
• Dynamic Random Access Memories
• Non-Volatile Memories
• Memory Testing
• Memory Faults
• Memory Patterns
• Memory Self Test
• BIST Concepts
• State Machine BIST
• Micro-Code BIST
• BIST and Redundancy
• Design For Test and BIST
• Conclusions.