Electromigration Modeling at Circuit Layout Level
Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels.� Electromigration (EM) of interconnects has...
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| Format: | Electronic |
| Language: | English |
| Published: |
Singapore :
Springer Singapore : Imprint: Springer,
2013.
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| Series: | SpringerBriefs in Applied Sciences and Technology,
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| Subjects: | |
| Online Access: | https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-981-4451-21-5 |