New Horizons of Applied Scanning Electron Microscopy

• Main Authors: Shimizu, Kenichi. (Author), Mitani, Tomoaki. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010.
• Series: Springer Series in Surface Sciences, 45
• Subjects: Engineering.; Nanotechnology.; Surfaces (Physics).; Materials Science.; Surfaces and Interfaces, Thin Films.; Measurement Science and Instrumentation.; Solid State Physics.; Spectroscopy and Microscopy.; Nanotechnology and Microengineering.
• Online Access: https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-3-642-03160-1
• Physical Description: XIV, 182p. 102 illus., 25 illus. in color. online resource.
• ISBN: 9783642031601
• ISSN: 0931-5195

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.