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100301s2010 xxu| s |||| 0|eng d |
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|a 9781441905529
|9 978-1-4419-0552-9
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|a 10.1007/978-1-4419-0552-9
|2 doi
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|a TK7800-8360
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|a TK7874-7874.9
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|a TJF
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|a 621.381
|2 23
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|a Sun, Yongke.
|e author.
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|a Strain Effect in Semiconductors
|b Theory and Device Applications /
|c by Yongke Sun, Scott E. Thompson, Toshikazu Nishida.
|h [electronic resource] :
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|a First.
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|a Boston, MA :
|b Springer US,
|c 2010.
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|b online resource.
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|a text
|b txt
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
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|a text file
|b PDF
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|a Stress, strain, piezoresistivity and piezoelectricity -- Strain and semiconductor crystal symmetry -- Band structures of strained semiconductors -- Low dimensional semiconductor structures -- Semiconductor transport -- Strain in electron devices -- Piezoresistive strain sensors -- Strain effects in optoelectronic devices -- Chapter heading.
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|a Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant applications of strain while also focusing on the fundamental physics as they pertain to bulk, planar, and scaled nano-devices. Lead authors Yongke Sun, Scott Thompson and Toshikazu Nishida also: Treat strain physics at both the qualitative overview level as well as provide detailed fundamentals Explain strain physics relevant to logic devices as well as strain-based MEMS This book is relevant to current strained Si logic technology, as well as for understanding the physics and scaling of future strain nano-scale devices. It is perfect for practicing device engineers at semiconductor manufacturers, as well as graduate students studying device physics at universities.
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|a Engineering.
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|a Electronics.
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|a Optical materials.
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|a Engineering.
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|a Electronics and Microelectronics, Instrumentation.
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|a Solid State Physics.
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|a Spectroscopy and Microscopy.
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|a Optical and Electronic Materials.
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|a Thompson, Scott E.
|e author.
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|a Nishida, Toshikazu.
|e author.
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|a SpringerLink (Online service)
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|t Springer eBooks
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|i Printed edition:
|z 9781441905512
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|u https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-1-4419-0552-9
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|a ZDB-2-ENG
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|a Engineering (Springer-11647)
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