Test Pattern Generation using Boolean Proof Engines
After producing a chip, the functional correctness of the integrated circuit has to be checked. Otherwise products with malfunctions would be delivered to customers, which is not acceptable for any company. Many algorithms for "Automatic Test Pattern Generation" (ATPG) have been proposed i...
| Main Authors: | , , , |
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| Corporate Author: | |
| Format: | Electronic |
| Language: | English |
| Published: |
Dordrecht :
Springer Netherlands,
2009.
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| Subjects: | |
| Online Access: | https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-90-481-2360-5 |