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Applied Scanning Probe Methods XII Characterization /

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast t...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Bhushan, Bharat. (Editor), Fuchs, Harald. (Editor)
Format: Electronic
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2009.
Series:NanoScience and Technology,
Subjects:
Chemistry.
Chemistry, Physical organic.
Polymers.
Nanotechnology.
Surfaces (Physics).
Surfaces and Interfaces, Thin Films.
Polymer Sciences.
Physical Chemistry.
Solid State Physics.
Spectroscopy and Microscopy.
Online Access:https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-3-540-85039-7
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490 1 # |a NanoScience and Technology,  |x 1434-4904 
505 0 # |a RH. Eibl: Direct Force Measurements of Receptor-Ligand Interactions on Living Cells -- D. Alsteens, V. Dupres, E. Dague, C. Verbelen, G. Andre, G. Francius and YF Dufrn̊e: Imaging Chemical Groups and Molecular Recognition Sites on Live Cells Using AFM -- P.G. Gucciardi: Applications of Scanning Near-Field Optical Microscopy in Life Science -- S. Bistac and M. Schmitt: Adhesion and Friction of Polymers at Nanoscale: Investigation by AFM -- G. Bolzon, M. Bocciarelli, and E.J. Chiarullo: Mechanical Characterisation of Materials by Microindentation and AFM Scanning -- G. Rubio-Bollinger, J.J. Riquelme, S. Vieira, and N. Agrait: Mechanical Properties of Metallic Nanocontacts -- A. Maali, T. Cohen-Bouhacina, C. Hurth, C. Jai, R. Boisgard, and J-P Aim:̌ Dynamic AFM in Liquid: Viscous Damping and Applications to Study Confined Liquid -- U. Lang and J. Dual: Microtensile Tests Using In Situ Atomic Force Microscopy -- H. Guo, Y. Wang, and H. Gao: Scanning Tunneling Microscopy of Si(100)-7x7 Surface and Adsorbed Ge Nanostructures. 
520 # # |a The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. 
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650 # 0 |a Chemistry, Physical organic. 
650 # 0 |a Polymers. 
650 # 0 |a Nanotechnology. 
650 # 0 |a Surfaces (Physics). 
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650 2 4 |a Nanotechnology. 
650 2 4 |a Surfaces and Interfaces, Thin Films. 
650 2 4 |a Polymer Sciences. 
650 2 4 |a Physical Chemistry. 
650 2 4 |a Solid State Physics. 
650 2 4 |a Spectroscopy and Microscopy. 
700 1 # |a Fuchs, Harald.  |e editor. 
710 2 # |a SpringerLink (Online service) 
773 0 # |t Springer eBooks 
776 0 8 |i Printed edition:  |z 9783540850380 
830 # 0 |a NanoScience and Technology,  |x 1434-4904 
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950 # # |a Chemistry and Materials Science (Springer-11644) 

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