Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques /

• Main Authors: Bhushan, Bharat. (Author), Fuchs, Harald. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
• Series: NanoScience and Technology,
• Subjects: Chemistry.; Chemistry, Physical organic.; Polymers.; Particles (Nuclear physics).; Nanotechnology.; Surfaces (Physics).; Surfaces and Interfaces, Thin Films.; Polymer Sciences.; Physical Chemistry.; Solid State Physics and Spectroscopy.
• Online Access: https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-3-540-85037-3

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast t...

Table of Contents:

• J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM
• E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation
• M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies
• M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science
• DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements
• L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip
• D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations
• M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.