Advanced Measurement and Test IV Selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China

Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3...

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Corporate Author: Selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China
Format: Electronic
Language:English
Published: Switzerland : Trans Tech Publications Ltd, 2015.
Subjects:
FBG
Online Access:Access Fulltext via EzAccess
Description
Summary:Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies Keyword: Materials Science; Material Processing and Testing Technology; Monitoring, Detection, Testing and Measurement Systems and Technologies The 37 papers cover materials science; material processing and testing technology; and systems and techniques for monitoring, detecting, testing, and measuring. The topics include the dependence of granular matrix demagnetizing factor on the matrix relative size, water-resistant material from fiber and acrylc emulsion terpolymer, measuring the thermo-radiation characteristics of infrared window materials, comparing optical and scintillation images obtained by using a fiber-optic beta/gamma imaging detector, and a dual-sequenced real coded genetic algorithm for picking process optimization. - Assessment and testing- Materials science- Materials science -- Research
Physical Description:230 p.: ill.
Format:Mode of access: World Wide Web.
Bibliography:Includes bibliographical references and index.
ISBN:9783038267591
3038267597