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00626nam a2200145Ia 4500 |
| 001 |
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2016321174339 |
| 008 |
160421s9999 xx 000 0 und d |
| 020 |
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|a 9780080944685 (eBook)
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| 100 |
1 |
0 |
|a Heyman, Joseph S.
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| 245 |
1 |
0 |
|a Electronics Reliability and Measurement Technology
|b nondestructive evaluation
|c Heyman, Joseph S.
|h [electronic resource]
|
| 260 |
# |
# |
|a Park Ridge
|b Noyes Data Corp
|c 1998
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| 300 |
# |
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|a 1 online resource
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| 650 |
# |
0 |
|a Integrated circuits
|v Congresses
|x Reliability
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| 856 |
4 |
0 |
|u https://ezaccess.library.uitm.edu.my/login?url=http://www.sciencedirect.com/science/book/9780815511717
|z View fulltext via EZaccess
|