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| LEADER |
00673nam a2200157Ia 4500 |
| 001 |
31109 |
| 005 |
20163218432 |
| 008 |
160421s9999 xx 000 0 und d |
| 020 |
# |
# |
|a 9780080474793 (eBook)
|
| 100 |
1 |
0 |
|a Wang, Laung-Terng
|
| 245 |
1 |
0 |
|a VLSI Test Principles and Architectures
|b design for testability
|c Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing
|h [electronic resource]
|
| 260 |
# |
# |
|a Amsterdam
|b Elsevier
|c 2006
|
| 300 |
# |
# |
|a 1 online resource
|
| 650 |
# |
0 |
|a Integrated circuits
|x Very large scale integration
|
| 700 |
1 |
0 |
|a Rudolph, Wolfgang.
|
| 856 |
4 |
0 |
|u https://ezaccess.library.uitm.edu.my/login?url=http://www.sciencedirect.com/science/book/9780123705976
|z View fulltext via EZaccess
|