Static Crosstalk-Noise Analysis For Deep Sub-Micron Digital Designs /
As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues and significant timing variation. Traditionally, static timing analysis tools have ignored cro...
| Main Authors: | , , |
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| Format: | Electronic |
| Language: | English |
| Published: |
Boston, MA :
Springer US,
2004.
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| Subjects: | |
| Online Access: | View fulltext via EzAccess |