Regular Fabrics in Deep Sub-Micron Integrated-Circuit Design
Regular Fabrics in Deep Sub-Micron Integrated-Circuit Design discusses new approaches to better timing-closure and manufacturability of DSM Integrated Circuits. The key idea presented is the use of regular circuit and interconnect structures such that area/delay can be predicted with high accuracy....
| Main Authors: | , |
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| Format: | Electronic |
| Language: | English |
| Published: |
Boston, MA :
Springer US,
2004.
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| Subjects: | |
| Online Access: | View fulltext via EzAccess |