CTL for Test Information of Digital ICS

• Main Author: Kapur, Rohit. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic
• Language: English
• Published: Boston, MA : Springer US, 2002.
• Subjects: Engineering.; Computer-aided engineering.; Electrical engineering.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.; Computer-Aided Engineering (CAD, CAE) and Design.
• Online Access: View fulltext via EzAccess

CTL is a language that is used to represent test information. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test informatio...

Table of Contents:

• Hello CTL
• Uses of CTL
• Design Philosophy of CTL
• Simplified View of CTL
• CTL Syntax and Semantics: Design Entities
• CTL Syntax and Semantics: Top Level View
• CTL Syntax and Semantics: Test Mode Constructs in the Environment
• CTL Syntax and Semantics: Shortcuts
• Examples Describing Test Information in CTL.