Design for AT-Speed Test, Diagnosis and Measurement

• Corporate Author: SpringerLink (Online service)
• Other Authors: Nadeau-Dostie, Benoit. (Editor)
• Format: Electronic
• Language: English
• Published: Boston, MA : Springer US, 2000.
• Series: Frontiers in Electronic Testing, 15
• Subjects: Engineering.; Electrical engineering.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.
• Online Access: View fulltext via EzAccess

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how...

Table of Contents:

• Technology Overview
• Memory Test and Diagnosis
• Logic Test and Diagnosis
• Embedded Test Design Flow
• Hierarchical Core Test
• Test and Measurement for PLLs and ADCs
• System Test and Diagnosis
• System Reuse of Embedded Test.