A DesignerỚ"s Guide to Built-In Self-Test

• Main Author: Stroud, Charles E. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic
• Language: English
• Published: Boston, MA : Springer US, 2002.
• Series: Frontiers in Electronic Testing, 19
• Subjects: Engineering.; Computer-aided engineering.; Electrical engineering.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.; Computer-Aided Engineering (CAD, CAE) and Design.
• Online Access: View fulltext via EzAccess

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is w...

Table of Contents:

• An Overview of BIST
• Fault Models, Detection, and Simulation
• Design for Testability
• Test Pattern Generation
• Output Response Analysis
• Manufacturing and System-Level Use of BIST
• Built-In Logic Block Observer
• Pseudo-Exhaustive BIST
• Circular BIST
• Scan-Based BIST
• Non-Intrusive BIST
• BIST for Regular Structures
• BIST for FPGAs and CPLDs
• Applying Digital BIST to Mixed-Signal Systems
• Merging BIST and Concurrent Fault Detection.