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100301s2002 ne | s |||| 0|eng d |
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|a 9780306471247
|9 978-0-306-47124-7
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|a 10.1007/0-306-47124-8
|2 doi
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|a QD450-882
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|a PNR
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|a SCI013050
|2 bisacsh
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|a 541
|2 23
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|a Xu, Renliang.
|e author.
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|a Particle Characterization: Light Scattering Methods
|c by Renliang Xu ; edited by Brian Scarlett.
|h [electronic resource] /
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| 264 |
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1 |
|a Dordrecht :
|b Springer Netherlands,
|c 2002.
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| 300 |
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|a XVII, 399 p.
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 347 |
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|a text file
|b PDF
|2 rda
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| 490 |
1 |
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|a Particle Technology Series,
|v 13
|x 1567-827X ;
|
| 505 |
0 |
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|a Particle Characterization -- Light Scattering -- Laser Diffraction -- Optical Particle Counting -- Photon Correlation Spectroscopy -- Electrophoretic Light Scattering.
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| 520 |
# |
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|a Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of modern particle characterization technology - the light scattering methods. This is the first monograph in particle science and technology covering the principles, instrumentation, data interpretation, applications, and latest experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 latest references are provided. The book is a must for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields.
|
| 650 |
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0 |
|a Chemistry.
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| 650 |
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0 |
|a Analytical chemistry.
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| 650 |
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0 |
|a Physical chemistry.
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| 650 |
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0 |
|a Physical measurements.
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| 650 |
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0 |
|a Measurement.
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| 650 |
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0 |
|a Materials science.
|
| 650 |
1 |
4 |
|a Chemistry.
|
| 650 |
2 |
4 |
|a Physical Chemistry.
|
| 650 |
2 |
4 |
|a Characterization and Evaluation of Materials.
|
| 650 |
2 |
4 |
|a Measurement Science and Instrumentation.
|
| 650 |
2 |
4 |
|a Analytical Chemistry.
|
| 700 |
1 |
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|a Scarlett, Brian.
|e editor.
|
| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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| 776 |
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8 |
|i Printed edition:
|z 9780792363002
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| 830 |
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|a Particle Technology Series,
|v 13
|x 1567-827X ;
|
| 856 |
4 |
0 |
|u https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/0-306-47124-8
|z View fulltext via EzAccess
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| 912 |
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|a ZDB-2-CMS
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| 912 |
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|a ZDB-2-BAE
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| 950 |
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|a Chemistry and Materials Science (Springer-11644)
|