Local Structure from Diffraction
This series of books, which is published at the rate of about one per year, addresses fundamental problems in materials science. The contents cover a broad range of topics from small clusters of atoms to engineering materials and involve chemistry, physics, materials science and engineering, with le...
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Other Authors: | , |
Format: | Electronic |
Language: | English |
Published: |
Boston, MA :
Springer US,
2002.
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Series: | Fundamental Materials Research,
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Subjects: | |
Online Access: | View fulltext via EzAccess |
Table of Contents:
- PDF Analysis Applied to Crystalline Materials
- Anomalous X-Ray Scattering from Disordered Materials
- The Recording and Interpretation of Diffuse X-Ray Scattering
- Recent Advances in Structure Refinement for Liquids and Disordered Materials
- Neutron Scattering and Monte Carlo Studies of Disorder in Oxides and Hydrides
- Reverse Monte Carlo Refinement of Disordered Silica Phases
- Modelling Single Crystal Diffuse Neutron Scattering Using Reverse Monte Carlo
- Real-Space Rietveld: Full Profile Structural Refinement of the Atomic Pair Distribution Function
- Advances in Pair Distribution Profile Fitting in Alloys
- Local Atomic Arrangements in Binary Solid Solutions Studied by X-Ray and Neutron Diffuse Scattering from Single Crystals
- Fermi Surface Effects in the Diffuse Scattering from Alloys
- Non-Mean-Field Theories of Short Range Order and Diffuse Scattering Anomalies in Disordered Alloys
- Diffuse Scattering by Crystals with Defects of Coulomb Displacement Field
- Short-Range Disorder and Long-Range Order: Implications of the ỚSRigid Unit ModeỚ<U+00fd> Picture
- Vibrational Entropy and Local Structures of Solids
- Diffuse Scattering by Domain Structures
- Recent ỚSLocalỚ<U+00fd> Structural Studies: Metallic Alloys, Superconductors and Proteins
- Studies of Local Structure in Polymers Using X-Ray Scattering
- Diffuse X-Ray and Neutron Reflection from Surfaces and Interfaces
- Studying Growth Kinetics of Metallic Multilayers Using Elastic X-Ray Diffuse Scattering.