Design and Analysis of Integrator-Based Log-Domain Filter Circuits

Design and Analysis of Integrator-Based Log-Domain Filter Circuits deals with the design and analysis of log-domain filter circuits. It describes several synthesis methods that aid the designer in developing bipolar or BiCMOS filter circuits with cut-off frequencies ranging from the low kilohertz ra...

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Bibliographic Details
Main Authors: Roberts, Gordon W. (Author), Leung, Vincent W. (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic
Language:English
Published: Boston, MA : Springer US, 2002.
Series:The International Series in Engineering and Computer Science, Analog Circuits and Signal Processing, 534
Subjects:
Online Access:View fulltext via EzAccess
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490 1 # |a The International Series in Engineering and Computer Science, Analog Circuits and Signal Processing,  |v 534  |x 0893-3405 ; 
505 0 # |a Log-Domain Integrators -- Log-Domain Filter Synthesis-I: Operational Simulation of LC Ladders -- Log-Domain Filter Synthesis-II: State-Space Formulation -- Nonideality Analysis of Biquadratic Log-Domain Filters -- Extending the Nonideality Analysis to High-Order Ladder Filters -- Experimental 1C Prototypes. 
520 # # |a Design and Analysis of Integrator-Based Log-Domain Filter Circuits deals with the design and analysis of log-domain filter circuits. It describes several synthesis methods that aid the designer in developing bipolar or BiCMOS filter circuits with cut-off frequencies ranging from the low kilohertz range to several hundreds of megahertz. Filter response deviations due to transistor-level nonidealities are systematically analyzed, leading to effective electronic compensation schemes. Numerous examples are provided in the text with measured experimental data from IC prototypes. Design and Analysis of Integrator-Based Log-Domain Filter Circuits is intended for engineers in research or development, as well as advanced-level engineering students. Extensive discussion on filter text metrics should also interest engineers who are responsible for testing high-performance, high-speed analog or mixed-signal products. 
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