Electrothermal Analysis of VLSI Systems

• Main Authors: Cheng, Yi-Kan. (Author), Tsai, Ching-Han. (Author), Teng, Chin-Chi. (Author), Kang, Sung-Mo Steve. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic
• Language: English
• Published: Boston, MA : Springer US, 2002.
• Subjects: Engineering.; Electrical engineering.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.
• Online Access: View fulltext via EzAccess

Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeli...

Table of Contents:

• The Building Blocks
• Power Analysis for CMOS Circuits
• Temperature-dependent MOS Device Modeling
• Thermal Simulation for VLSI Systems
• Fast-timing Electrothermal Simulation
• The Applications
• Temperature-dependent Electromigration Reliability
• Temperature-driven Cell Placement
• Temperature-driven Power and Timing Analysis.