Design, Analysis and Test of Logic Circuits Under Uncertainty

• Main Authors: Krishnaswamy, Smita. (Author), Markov, Igor L. (Author), Hayes, John P. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic
• Language: English
• Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2013.
• Series: Lecture Notes in Electrical Engineering, 115
• Subjects: Engineering.; Computer hardware.; Computer science.; Logic design.; Operating systems (Computers).; Algebra > Data processing.; Systems engineering.; Circuits and Systems.; Arithmetic and Logic Structures.; Computer Hardware.; Performance and Reliability.; Logic Design.; Symbolic and Algebraic Manipulation.
• Online Access: https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-90-481-9644-9

Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits. �To improve future semiconductor designs,...

Table of Contents:

• Introduction
• Probabilistic Transfer Matrices
• Computing with Probabilistic Transfer Matrices
• Testing Logic Circuits for Probabilistic Faults
• Signtaure-based Reliability Analysis
• Design for Robustness
• Summary and Extensions.