Transmission Electron Microscopy and Diffractometry of Materials

• Main Authors: Fultz, Brent. (Author), Howe, James. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
• Edition: 4th ed. 2013.
• Series: Graduate Texts in Physics,
• Subjects: Physics.; Spectroscopy.; Surfaces (Physics).; Spectroscopy and Microscopy.; Characterization and Evaluation of Materials.; Spectroscopy/Spectrometry.; Surfaces and Interfaces, Thin Films.; Surface and Interface Science, Thin Films.
• Online Access: https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-3-642-29761-8

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A ne...

Table of Contents:

• Diffraction and X-Ray Powder Diffractometer Problems
• TEM and its Optics Problems
• Neutron Scattering Problems
• Scattering Problems
• Inelastic Electron Scattering and Spectroscopy Problems
• Diffraction from Crystals Sphere Problems
• Electron Diffraction and Crystallography Problems
• Diffraction Contrast in TEM Images Problems
• Diffraction Lineshapes Problems
• Patterson Functions and Diffuse Scattering Problems
• High-Resolution TEM Imaging Problems
• High-Resolution STEM and Related Imaging Techniques Problems
• Dynamical Theory Problems.