Analog IC Reliability in Nanometer CMOS

• Main Authors: Maricau, Elie. (Author), Gielen, Georges. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic
• Language: English
• Published: New York, NY : Springer New York : Imprint: Springer, 2013.
• Series: Analog Circuits and Signal Processing
• Subjects: Engineering.; Electronics.; Systems engineering.; Circuits and Systems.; Electronics and Microelectronics, Instrumentation.; Nanotechnology and Microengineering.
• Online Access: https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-1-4614-6163-0

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit r...

Table of Contents:

• Introduction
• CMOS Reliability Overview
• Transistor Aging Compact Modeling
• Background on IC Reliability Simulation
• Analog IC Reliability Simulation
• Integrated Circuit Reliability
• Conclusions.