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100715s2010 gw | s |||| 0|eng d |
| 020 |
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|a 9783642035357
|9 978-3-642-03535-7
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|a 10.1007/978-3-642-03535-7
|2 doi
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|2 bisacsh
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|a 620.115
|2 23
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| 100 |
1 |
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|a Bhushan, Bharat.
|e editor.
|
| 245 |
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|a Scanning Probe Microscopy in Nanoscience and Nanotechnology
|c edited by Bharat Bhushan.
|h [electronic resource] /
|
| 264 |
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1 |
|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg,
|c 2010.
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| 300 |
# |
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|a XXX, 956p. 300 illus.
|b online resource.
|
| 336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
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|a online resource
|b cr
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| 347 |
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|a text file
|b PDF
|2 rda
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| 490 |
1 |
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|a NanoScience and Technology,
|x 1434-4904
|
| 520 |
# |
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|a This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber
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| 650 |
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|a Materials.
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| 650 |
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|a Engineering.
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| 650 |
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|a Nanotechnology.
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| 650 |
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4 |
|a Material Science.
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| 650 |
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4 |
|a Nanotechnology.
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| 650 |
2 |
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|a Condensed Matter Physics.
|
| 650 |
2 |
4 |
|a Engineering, general.
|
| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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| 776 |
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8 |
|i Printed edition:
|z 9783642035340
|
| 830 |
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|a NanoScience and Technology,
|x 1434-4904
|
| 856 |
4 |
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|u https://ezaccess.library.uitm.edu.my/login?url=http://dx.doi.org/10.1007/978-3-642-03535-7
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| 912 |
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|a ZDB-2-CMS
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| 950 |
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|a Chemistry and Materials Science (Springer-11644)
|