Ubar, R., Raik, J., & Vierhaus, H. T. (2011). Design and test technology for dependable systems-on-chip. Hershey, Pa.: IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA).
Chicago Style CitationUbar, Raimund, Jaan Raik, and Heinrich Theodor Vierhaus. Design and Test Technology for Dependable Systems-on-chip. Hershey, Pa.: IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA), 2011.
MLA CitationUbar, Raimund, Jaan Raik, and Heinrich Theodor Vierhaus. Design and Test Technology for Dependable Systems-on-chip. Hershey, Pa.: IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA), 2011.
Warning: These citations may not always be 100% accurate.