APA Citation

Joy, D. C. (2013). Helium Ion Microscopy: Principles and Applications. New York, NY: Springer New York : Imprint: Springer.

Chicago Style Citation

Joy, David C. Helium Ion Microscopy: Principles and Applications. New York, NY: Springer New York : Imprint: Springer, 2013.

MLA Citation

Joy, David C. Helium Ion Microscopy: Principles and Applications. New York, NY: Springer New York : Imprint: Springer, 2013.

Warning: These citations may not always be 100% accurate.